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United States Patent | 6,073,264 |
Nelson ,   et al. | June 6, 2000 |
The present invention discloses a debug tool to provide a test vector to a device under test. The debug tool comprises: (1) a pattern generator unit coupled to the device under test to transmit the test vector to the device under test and to generate a master triggering signal; (2) a waveform acquisition unit coupled to the device under test to receive a first test output from the device under test, the first test output being generated by the device under test in response to the transmitted test vector; and (3) a trigger unit coupled to the pattern generator unit, the waveform acquisition unit, and the device under test to synchronize the pattern generator unit, the waveform acquisition unit, and the device under test.
Inventors: | Nelson; Mark B. (Folsom, CA); Clark; Richard F. (Roseville, CA); Watrobski; Ken R. (Shingle Spring, CA) |
Assignee: | Intel Corporation (Santa Clara, CA) |
Appl. No.: | 053936 |
Filed: | April 2, 1998 |
Current U.S. Class: | 714/738; 702/67; 714/735; 714/736 |
Intern'l Class: | G01R 031/28 |
Field of Search: | 714/738,718,724,735,740,744,743,732,736 324/121 R,158.1,111,76.11,73.1 |
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5412662 | May., 1995 | Honma et al. | 714/718. |
5463639 | Oct., 1995 | Koishi et al. | 714/740. |
5508607 | Apr., 1996 | Gibson | 324/121. |
5731984 | Mar., 1998 | Ullmann | 702/67. |
5854804 | Dec., 1998 | Winer et al. | 372/38. |