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United States Patent |
5,631,866
|
Oka
,   et al.
|
May 20, 1997
|
Semiconductor memory device
Abstract
A synchronous DRAM is disclosed. The DRAM comprises an input buffer, a
memory cell array, an output buffer, a signal transfer circuit, first and
second latch circuits, and a controller. The input buffer receives an
operation control signal supplied externally. The memory cell array has a
plurality of memory cells for storing data. The output buffer outputs a
data signal read from the memory cells. The signal transfer circuit reads
a data signal from one of the memory cells in accordance with the
operation control signal from the input buffer, and sends this read data
signal to the output buffer. The first and second latch circuits, provided
between the input buffer and the output buffer, latch the associated input
signals in response to a clock signal. The controller controls the
latching operation of the second latch circuit by delaying the clock
signal input to the second latch circuit for a period of time from when
the first latch circuit receives input from the input buffer to when the
read data signal arrives at the second latch circuit.
Inventors:
|
Oka; Tomoharu (Kawasaki, JP);
Kodama; Yukinori (Kawasaki, JP);
Shigenobu; Katsumi (Kawasaki, JP)
|
Assignee:
|
Fujitsu Limited (Kawasaki, JP)
|
Appl. No.:
|
444579 |
Filed:
|
May 19, 1995 |
Foreign Application Priority Data
Current U.S. Class: |
365/189.05; 365/194; 365/230.03; 365/233 |
Intern'l Class: |
G11C 007/00; G11C 008/00 |
Field of Search: |
365/189.05,194,230.03,230.08,233
371/38
|
References Cited
U.S. Patent Documents
4845664 | Jul., 1989 | Aichelmann, Jr. et al. | 371/38.
|
5319607 | Jun., 1994 | Fujii et al. | 365/233.
|
5341341 | Aug., 1994 | Fukuzo | 365/233.
|
5384745 | Jan., 1995 | Konishi et al. | 365/230.
|
5440511 | Aug., 1995 | Yamamoto et al. | 365/189.
|
5483497 | Jan., 1996 | Mochizuki et al. | 365/230.
|
Primary Examiner: Nelms; David C.
Assistant Examiner: Phan; Trong
Attorney, Agent or Firm: Armstrong, Westerman, Hattori, McLeland & Naughton
Claims
What is claimed is:
1. A semiconductor memory device which operates in response to a control
signal and a clock signal, said device comprising:
a memory cell array having a plurality of memory cells for storing data;
a first latch circuit responsive to said clock signal for receiving said
control signal, and for providing a received control signal as a first
received output signal;
a signal transfer circuit coupled to said memory cell array for reading a
cell data signal from one of said memory cells in accordance with said
first received output signal, and for transferring said read data signal
therefrom;
a second latch circuit coupled to said signal transfer circuit for
receiving said read data signal transferred from said signal transfer
circuit, and for providing the received read data signal as a second
received output signal; and
a controller, coupled to said second latch circuit and responsive to said
clock signal, for controlling a rate at which said clock signal arrives
said second latch circuit according to a period of time from when said
first latch circuit receives said control signal to when said read data
signal transferred from said signal transfer circuit arrives at said
second latch circuit, and for providing a rate controlled clock signal to
said second latch circuit, wherein said second latch circuit receives said
read signal in response to said rate controlled clock signal.
2. The semiconductor memory device according to claim 1, wherein said
controller delays said clock signal according to the period of time from
when said first latch circuit receives said control signal to when said
read data signal transferred from said signal transfer circuit arrives at
said second latch circuit and provides a delayed clock signal to said
second latch circuit.
3. The semiconductor memory device according to claim 1, wherein said
signal transfer circuit includes a select circuit coupled to said first
latch circuit for selecting one of said memory cells in accordance with
said first received output signal, and for producing a select signal; and
a data signal transfer circuit coupled between said select circuit and said
memory cell array for reading a cell data signal from said selected memory
cell in accordance with said select signal, and for transferring said read
data signal to said second latch circuit.
4. The semiconductor memory device according to claim 1 further comprising
an input buffer coupled to said first latch circuit for buffering said
control signal input to said memory device and for providing said first
latch circuit with buffered control signal, wherein said first latch
circuit receives said buffered control signal; and
an output buffer coupled to said second latch circuit for buffering said
second received output signal provided by said second latch circuit and
for providing buffered read signal as an output signal from said memory
device.
5. The semiconductor memory device according to claim 4, wherein said
control signal contains a memory cell address signal, and
wherein said input buffer includes an address buffer responsive to said
address signal to produce a column address signal;
wherein said first latch circuit includes a column address latch circuit to
receive the column address signal;
wherein said signal transfer circuit includes sense buffer for amplifying
the data signal read from said memory cell array;
wherein said second latch circuit receives an amplified data signal
provided by said sense buffer and provides the received amplified data
signal as a second received output signal.
6. The semiconductor memory device according to claim 4 further comprising
a third latch circuit, coupled between said second latch circuit and said
output buffer and responsive to said clock signal for receiving said
second received output signal provided by said second latch circuit.
7. The semiconductor memory device according to claim 1, wherein said
controller includes a plurality of connected inverter circuits.
8. The semiconductor memory device according to claim 1, wherein said
controller includes a delay circuit to control the rate at which said
clock signal arrives said second latch circuit.
9. The semiconductor memory device according to claim 8, wherein said delay
circuit includes a series connected inverter circuits.
10. The semiconductor memory device according to claim 9, wherein said
delay circuit includes a resistor coupled between two inverter circuits,
and a capacitor coupled between said resistor and ground.
11. The semiconductor memory device according to claim 1, wherein said
device is formed on each of a plurality of banks in a semiconductor chip,
and wherein said controller is formed in each bank.
Description
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates generally to a semiconductor memory device.
More particularly, this invention relates to a semiconductor memory device
which performs data input and output operation in synchronism with a clock
signal.
2. Description of the Related Art
Dynamic Random Access Memory (DRAM) is an increasingly popular choice of
memory device for use as a component in many of today's computer
processors. One reason for this is its small size. A second reason for the
popularity of DRAM today is its capacity for high speed operation. In
particular, synchronous DRAM devices perform input/output operations in
synchronism with a clock signal. This makes synchronous DRAM an ideal
complement to the progressively faster processing units in computers
today.
FIGS. 1 and 2 illustrate a conventional synchronous DRAM. The synchronous
DRAM 100 has a clock buffer 1, a control signal latch circuit 2, a row
address latch circuit 3, a column address latch circuit 4, a group of
latch circuits 5, an output latch circuit 6, a command decoder 7, a memory
cell array 8, an address buffer 9, a row decoder 10, a column decoder 11,
a sense buffer and I/O gate 12, a data selector 13 and an output buffer
14.
The clock buffer 1 receives and temporarily holds a clock signal CLK output
from an external clock generator (not shown), and supplies the clock
signal CLK to the control signal latch circuit 2, the row address latch
circuit 3, the column address latch circuit 4, the latch circuits 5 (see
FIG. 2) and the output latch circuit 6.
The command decoder 7 receives control signals /RAS and /CAS and a write
enable signal/WE, output from an external control circuit (not shown) such
as a CPU, and outputs those signals to the control signal latch circuit 2.
The control signal latch circuit 2 latches the individual control signals
/RAS, /CAS and /WE and outputs them to a peripheral circuit (e.g., the
output buffer 14) of the memory cell array 8 in response to the clock
signal CLK.
The address buffer 9 receives an address signal AD from an external control
circuit (not shown) and divides it into a row address signal and a column
address signal. The address buffer 9 sends the row address signal to the
row address latch circuit 3 and sends the column address signal to the
column address latch circuit 4. The row address latch circuit 3 latches
the row address signal in synchronism with the clock signal CLK and
outputs the signal to the row decoder 10. The column address latch circuit
4 latches the column address signal in synchronism with the clock signal
CLK and outputs it to the column decoder 11.
The row decoder 10 decodes the row address signal to produce a word line
select signal and outputs this signal to the memory cell array 8. In
accordance with this word line select signal, a specific word line is
selected from a plurality of word lines in the memory cell array 8. The
column decoder 11 decodes the column address signal to produce a bit line
select signal and outputs this signal to the latch circuits 5. The latch
circuits 5 latch the bit line select signal from the column decoder 11 in
synchronism with the clock signal CLK, and output this select signal to
the sense buffer and I/O gate 12.
The sense buffer and I/O gate 12 selects a specific column from a plurality
of columns (each column consisting of a pair of bit lines) in the memory
cell array 8 in response to the bit line select signal from the column
decoder 11. The memory cell array 8 has the word lines, pairs of bit
lines, and multiple memory cells connected to the word lines and the pairs
of bit lines. In a reading operation from the memory cells, the sense
buffer and I/O gate 12 first reads data signal from those memory cells in
the memory cell array 8 selected by the individual select signals via the
row decoder 10 and the column decoder 11. The sense buffer and I/O gate 12
then outputs the data signal to the data selector 13. The data selector 13
in turn outputs the cell data signal from the sense buffer and I/O gate 12
to the output latch circuit 6. The output latch circuit 6 latches the data
output signal from the data selector 13 in synchronism with the clock
signal CLK, and outputs this signal to the output buffer 14. The output
buffer 14 outputs the read cell data signal as a read data signal Dout.
The synchronous DRAM 100 further has an input buffer and a write amplifier,
neither illustrated. During writing operations, the write amplifier
receives write data output from the external control circuit (not shown)
via the input buffer and writes it to the memory cells selected by the
address signal AD.
FIG. 2 shows the specific structures of the latch circuits 5, the sense
buffer and I/O gate 12 and the memory cell array 8. The memory cell array
8 has a plurality of memory cells, a plurality of bit line pairs BL0 and
/BL0 to BLn and /BLn, and a plurality of word lines WL. A plurality of
memory cells 15 are respectively provided between each bit line pair and
between word lines WL. One of the word lines WL is selected in accordance
with the word line select signal from the row decoder 10.
The sense buffer and I/O gate 12 has a plurality of pairs of transfer
transistors Tr0 to Trn and a sense buffer (or sense amplifier) 12a. The
individual bit line pairs BL0 and/BL0 to BLn and/BLn are connected to data
buses DB and /DB via the respective transfer transistor pairs Tr0 to Trn.
The transfer transistor pairs Tr0 to Trn have gates connected to the
output terminals (not shown) of individual latch circuits 5a to 5h (eight
latch circuits in this example) that form the group of latch circuits 5.
The latch circuits 5a-5h receive the select signal from the column decoder
11 and the clock signal CLK. In synchronism with this clock signal CLK,
the individual latch circuits 5a-5h respectively send an output signal
corresponding to the select signal from the column decoder 11 to the gates
of the respective transfer transistor pairs Tr0-Trn. In response to this
output signal, one pair of transfer transistors among the transfer
transistor pairs Tr0-Trn turn on, allowing the cell 15 connected to the
selected one word line WL to be read on the data buses DB and /DB via the
associated bit line pair. The data buses DB and /DB are connected to the
sense buffer 12a, which amplifies the cell data signal read on the data
buses DB and /DB and outputs the amplified data signal to the data
selector 13.
When data is read from the synchronous DRAM 100, the row address latch
circuit 3, upon receiving the clock signal CLK, sequentially latches the
row address signals output from the address buffer 9 and outputs them to
the row decoder 10.
As shown in FIG. 3, upon reception of a first clock signal CLK.sub.2 which
is one pulse of the clock signal CLK, the column address latch circuit 4
latches the column address signal from the address buffer 9 and outputs
the signal to the column decoder 11. The column decoder 11 decodes the
column address signal and sends a bit line select signal to the latch
circuits 5.
Then, the latch circuits 5 latch the select signal from the column decoder
11 and send the latched signal to the sense buffer and I/O gate 12 in
synchronism with a second clock signal CLK.sub.2. A memory cell 15 is
selected in accordance with the select signals from the row decoder 10 and
the column decoder 11, and a data signal is read from this memory cell.
The sense buffer 12a amplifies the read data signal and sends it to the
output latch circuit 6 via the data selector 13.
Next, the output latch circuit 6 latches the output data signal of the data
selector 13 and outputs it to the output buffer 14 in synchronism with a
third clock signal CLK.sub.3. The output buffer 14 in turn outputs the
output data signal Dout.
The aforementioned latch circuits 3 to 6 latch signals and send them to the
circuits 10, 11, 12 and 14 every period of the clock signal CLK. The
output buffer 14 outputs a data signal Dout every time each of the latch
circuits 3-6 performs the latching operation. The synchronous DRAM 100
performs a one-cycle reading operation at every third pulse of the clock
signal CLK. As the latch circuits 3-6 latch signals in synchronism with
the clock signal, stable signal transfer is possible. Consequently, the
time for the signal transfer can be shortened by increasing the frequency
of the clock signal CLK, thus improving the speed with which cell data
signals can be read.
The above-described synchronous DRAM 100 however requires that the period
of the clock signal CLK should be set with a period longer than a selected
time interval such as the time t2 from when the latch circuits 5 latches
the select signal to when the cell data signal output by the data selector
13 arrives at the output latch circuit 6. Nonetheless, time period t2,
should approach or equal time period t1. This is because the operation of
the DRAM during each period requires a single period of the clock signal
CLK. In other words, the individual latch circuits 4 to 6 should be
designed to match the time period t1 with the time period t2. The period
t1 is a transfer time from when the latch circuit 4 latches the column
address signal to when the select signal arrives at the latch circuits 5.
The period t2 is a transfer time from when the latch circuits 5 latches
the select signal to when the cell data signal output by the data selector
13 arrives at the output latch circuit 6.
Further, the synchronous DRAM 100 has the latch circuits 5a-5h between the
column decoder 11 and the sense buffer and I/O gate 12, one for each
column (bit line pair). This particular arrangement of the latch circuits
5a-5h increases the circuit area of the latch circuit group 5 and thus
enlarges the chip (semiconductor integrated circuit).
SUMMARY OF THE INVENTION
Accordingly, it is a primary objective of the present invention to provide
a synchronous DRAM whose operation speed can be increased while reducing
the circuit area.
It is another objective of this invention to provide a synchronous DRAM
which eliminates the need for the time for signal transfer between latch
circuits to be set equal to the period of the clock signal.
To achieve the foregoing and other objects and in accordance with the
purpose of the present invention, an improved semiconductor memory device
is provided, which includes by reference to the following description
taken in conjunction with the following figures.
BRIEF DESCRIPTION OF THE DRAWINGS
The features of the present invention that are believed to be novel are set
forth with particularity in the appended claims. The invention, together
with objects and advantages thereof, may best be understood by reference
to the following description of the presently preferred embodiments
together with the accompanying drawings.
FIG. 1 is a block diagram illustrating a conventional synchronous DRAM;
FIG. 2 is a circuit diagram showing a conventional sense buffer and I/O
gate;
FIG. 3 is a diagram for explaining the operation of the conventional
synchronous DRAM;
FIG. 4 is a diagram for explaining the outline of the present invention;
FIG. 5 is a block diagram illustrating a synchronous DRAM according to one
embodiment;
FIG. 6 is a circuit diagram showing a sense buffer and I/O gate;
FIG. 7 is a circuit diagram showing a control signal generator;
FIG. 8 is a diagram for explaining the operation of the synchronous DRAM
according to this embodiment;
FIG. 9 is a schematic diagram showing a synchronous DRAM having two banks;
and
FIG. 10 is an explanatory diagram schematically showing a synchronous DRAM
according to another embodiment.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
As shown in FIG. 4, a semiconductor memory device comprises a memory cell
array 22, a signal transfer circuit 24, first and second latch circuits 25
and 26, and a controller 27. The memory cell array 22 has a plurality of
memory cells for storing data. The first latch circuit 25 receives the
control signal in response to a clock signal CLK, and provides a received
control signal CS. The signal transfer circuit 24 is coupled to the memory
cell array 24. The signal transfer circuit 24 reads a cell data signal
from one of the memory cells in accordance with the provided control
signal CS, and transfers the read data signal therefrom. The second latch
circuit 26 is coupled to the signal transfer circuit 24. The second latch
circuit 26 receives the read data signal transferred from the signal
transfer circuit 24, and provides the received read data signal. The
controller 27 is coupled to the second latch circuit 26. The controller 27
is responsive to the clock signal CLK, and controls a rate, at which the
second latch circuit 26 receives the read data signal, according to a
period of time from when the first latch circuit 25 receives the control
signal CS to when the read data signal transferred from the signal
transfer circuit 24 arrives at the second latch circuit 26.
This type of clock signal control eliminates the need to set the signal
transference between the first and second latch circuits 25 and 26 equal
to the period of the clock signal CLK. In other words, after the second
latch circuit 26 receives a signal, the controller 27 outputs a clock
signal CLKa to the second latch circuit 26. The second latch circuit 26
performs the signal latching operation in response to the clock signal
CLKa. The first and second latch circuits 25 and 26 can therefore perform
stable operations in synchronism with the clock signal CLK. It is thus
possible to improve the operation speed by increasing the frequency of the
clock signal CLK.
A synchronous DRAM according to one embodiment of the present invention
will now be described referring to FIGS. 5 through 9. In this embodiment,
the present invention is adapted for a synchronous DRAM as shown in FIG.
5. Like or same reference numerals as used for the prior art will be given
to corresponding or identical components, and their explanation will not
be given below.
A synchronous DRAM 200 shown in FIG. 5, unlike the conventional synchronous
DRAM 100, does not have latch circuits 5 shown in FIG. 1 between a column
decoder 11 and a sense buffer and I/O gate 12. The synchronous DRAM 200
however has another latch circuit 17 and a control signal generator 16,
which are not incorporated in the synchronous DRAM 100 in FIG. 1. The
latch circuit 17 is provided between the sense buffer and I/O gate 12 and
a data selector 13. The control signal generator 16 receives a clock
signal CLK from a clock buffer 1 and outputs a clock signal CLKa with a
slight delay to the latch circuit 17 as a control signal. The latch
circuit 17 operates in response to the control signal from the control
signal generator 16. The other components of the synchronous DRAM 200 are
the same as that of the DRAM in FIG. 1.
FIG. 6 shows the connections among the column decoder 11, the sense buffer
and I/O gate 12 and the latch circuit 17. A plurality of memory cells 15
are respectively connected to plural pairs of bit lines BL0 and /BL0 to
BLn and /BLn, arranged in a memory cell array 8. Word lines WL are
connected to the associated memory cells 15. One of the word lines WL is
selected in accordance with a word line select signal from the row decoder
10. The individual bit line pairs BL0 and /BL0 to BLn and /BLn are
connected to data buses DB and /DB via respective transfer transistor
pairs Tr0 to Trn. The transfer transistor pairs Tr0 to Trn, connected to
the respective bit line pairs, have gates to which the output signal
(select signal) of the column decoder 11 is input. The sense buffer 12a,
connected to the data buses DB and /DB, amplifies the cell data signal
read on the data buses DB and/DB and outputs the amplified data signal to
the latch circuit 17. For example, eight pairs of bit lines are connected
to the data buses DB and /DB, and a single sense buffer 12a is connected
to the data buses DB and /DB. The latch circuit 17 latches the cell data
signal output from the sense buffer 12a in response to the control signal
from the control signal generator 16, and sends the data to the data
selector 13.
FIG. 7 is a circuit diagram of the control signal generator 16. The
generator 16 has a series circuit of six stages of inverter circuits 18
and resistors R connected between adjacent inverter circuits 18 starting
from the second stage of inverter circuit. The input terminals of the
third to sixth stages of inverter circuits 18 are connected via capacitors
C to the ground as a low-potential power supply Vss. The generator 16
receives the clock signal CLK from the input terminal of the first stage
of inverter circuit 18 and sends the control signal CLKa to the latch
circuit 17 from the output terminal of the last stage of inverter circuit
18. The generator 16 outputs the clock signal CLKa, which is delayed from
the input clock signal CLK by a delay time determined by the resistors R
and the capacitors C. The generator 16 is designed in such a way that the
sum of the delay time and the time for one period of the clock signal CLK
is longer than the time period t3. As shown in FIG. 8, the period t3 is a
transfer time from when the column address latch circuit 4 latches the
column address signal to when the amplified data signal provided by the
sense buffer 12a arrives at the latch circuit 17. Column decoder 11 and
sense buffer and I/O gate 12, as shown in FIG. 8 is essentially the same
circuit as the signal transfer circuit 24 depicted in FIG. 4.
During a reading operation from the above-described synchronous DRAM 200,
the row address latch circuit 3 in response to the clock signal CLK
sequentially latches the row address signals output from the address
buffer 9 and outputs them to the row decoder 10.
As shown in FIG. 8, upon reception of a first clock signal CLK.sub.1 which
is one pulse of the clock signal CLK.sub.1, the column address latch
circuit 4 latches the column address signal from the address buffer 9 and
outputs the signal to the column decoder 11. The column decoder 11 decodes
the column address signal and sends a bit line select signal to the sense
buffer and I/O gate 12. A memory cell 15 is selected in accordance with
the select signals from the row decoder 10 and the column decoder 11 and a
data signal is read from that cell 15. The sense buffer 12a amplifies the
cell data signal and outputs it to the latch circuit 17.
In response to a second clock signal CLK.sub.2, the control signal
generator 16 sends a clock signal CLKa.sub.2 obtained by delaying the
signal CLK2 to the latch circuit 17. In synchronism with the delayed clock
signal CLKa2, the latch circuit 17 latches the output data signal from the
sense buffer 12a and sends it to the data selector 13. The data selector
13 outputs the cell data signal from the latch circuit 17 to the output
latch circuit 6.
Next, the output latch circuit 6 latches the output data signal of the data
selector 13 and outputs it to the output buffer 14 in synchronism with a
third clock signal CLK.sub.3. The output buffer 14 in turn outputs the
output data signal Dout as a read data signal.
In the above-described synchronous DRAM 200, the control signal generator
16 sends the clock signal CLKa (clock signal CLKa.sub.2), which is the
clock signal CLK delayed, to the latch circuit 17. Operation of the latch
circuit 17 is based on the delayed clock signal CLKa. The period of
delayed clock signal CLKa is the period of clock signal CLK delayed in
accordance with the period t3.
The output of the clock signal CLKa from the generator 16 after the
elapsing of the time t3 eliminates the need to match the signal transfer
time t3 with the period of the clock signal CLK. Adjusting the delay by
which the generator 16 outputs the clock signal CLK, allows for
synchronizing the operation of the column address latch circuit 4, the
latch circuit 17 and the output latch circuit 6 based on the clock signal
CLK. This eliminates the necessity of setting the period of the clock
signal to match the larger of the two propagation delays between
individual latch circuits. This allows the frequency of the clock signal
CLK to be increased, thereby improving the speed of reading a cell data
signal.
Unlike the prior art, this embodiment requires no latch circuit for each
column (bit line pair) and needs just one latch circuit 17 at the
subsequent stage of the sense buffer 12a. In the case where one sense
buffer 12a is provided for eight columns, for instance, the prior art has
eight latch circuits 5a-5h at the subsequent stage of the column decoder
11, whereas this embodiments needs a single latch circuit 17 at the
subsequent stage of sense buffer 12a. The present invention therefore
allows for a reduction in the overall size of the DRAM device.
A synchronous DRAM 300 according to this invention is formed on a
semiconductor chip 310, and has two banks 320 on the semiconductor chip
310 as shown in, for example, FIG. 9. The individual banks 320 have the
same structure as the above-described synchronous DRAM 200, and
independently perform the read or write operation in accordance with the
same address signal. In this DRAM 300, the control signal generator 16 is
provided in each bank 320 to set the delay time of the clock signal CLK
for the associated bank 320. Both generators 16 contribute to improving
the operation speed of the independently operating banks 320.
Although only one embodiment of the present invention has been described
herein, it should be apparent to those skilled in the art that the present
invention may be embodied in many other specific forms without departing
from the spirit or scope of the invention. Particularly, it should be
understood that this invention may be embodied in the following forms.
The number of the inverter circuits 18 in the control signal generator 16
or the number of the resistors and capacitors may be changed in accordance
with the delay time set for the clock signal CLK.
Although the above-described embodiment is designed for use with data
reading operations from the memory cell array 8, this invention may be
adapted for the data signal writing operation. As shown in FIG. 10, for
example, a synchronous DRAM 400 has an input buffer 31, a memory cell
array 32, a data transfer circuit 33, first and second latch circuits 34
and 35 and a controller 36. The input buffer 31 receives an operation
control signal CS and a write data signal WD, and provides the first latch
circuit 34 with the control signal CS and the write data signal WD. The
memory cell array 32 has a plurality of memory cells for storing data. The
first latch circuit 34 latches the control signal CS and the write data
signal WD in response to a clock signal CLK, and provides the data
transfer circuit 33 with the control signal CS and the write data signal
WD. The data transfer circuit 33 is coupled between the first and second
latch circuits 34 and 35. The circuit 33 selects one of the memory cells
in accordance with the control signal CS, and produces a select signal.
The circuit 33 transfers the select signal and the write data signal WD to
the memory cell array 32 via the second latch circuit 35. The second latch
circuit 35 latches the select signal and the write data signal WD. The
controller 36 is coupled to the second latch circuit 35. The controller 36
is responsive to the clock signal CLK, and controls a rate at which the
second latch circuit 35 latches the select signal and the write data
signal WD according to a period of time from when the first latch circuit
34 latches the control signal CS and the write data signal WD to when the
select and write data signals transferred from the data transfer circuit
33 arrive at the second latch circuit 35. With this structure, even if the
data transfer time between the first and second latch circuits 34 and 35
differs from the period of the clock signal CLK, the controller 36 outputs
the clock signal CLKa to the second latch circuit 35 after the select and
write data signals have been arrived at the second latch circuit 35. The
second latch circuit 35 executes the stable signal latching in accordance
with the clock signal CLKa from the controller 36.
Therefore, the present examples and embodiments are to be considered as
illustrative and not restrictive and the invention is not to be limited to
the details given herein, but may be modified within the scope of the
appended claims.
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