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United States Patent | 5,548,221 |
Adamian ,   et al. | August 20, 1996 |
A multistate electronic transfer standard provides electronic conditions to at least one of two ports of a vector network analyzer. One embodiment of the multistate electronic transfer standard includes a plurality of semiconductor interconnected by transmission lines. Each of the semiconductor devices are biased to generate different conditions at each of the two ports. A control computer controls the biasing of devices according to a predetermined procedure and compares impedance values measured for at least one of the two ports of the network analyzer to known values stored by the control computer. The control computer thereby derives calibration coefficients that are used by the network analyzer in performing further measurements.
Inventors: | Adamian; Vahe A. (Lexington, MA); Falcinelli; Michael T. (Andover, MA); Phillips; Peter V. (Leominster, MA) |
Assignee: | ATN Microwave, Inc. (Billerica, MA) |
Appl. No.: | 473724 |
Filed: | June 7, 1995 |
Current U.S. Class: | 324/601; 324/638; 333/17.1; 333/18 |
Intern'l Class: | G01R 027/04 |
Field of Search: | 324/601,650,651,638 333/17.1,18 |
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