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| United States Patent |
5,013,902
|
|
Allard
|
May 7, 1991
|
Microdischarge image converter
Abstract
A proximity focused direct view, microdischarge electro-optical converter
for converting a target scene into an enhanced visible image, whereby an
optical target scene impinging on the input surface of a detector converts
the photons of the optical scene into electrons, where upon an
electrostatic lens focusses and enhances the resulting electron equivalent
image onto a phosphor screen for effecting a direct view optically
enhanced image.
| Inventors:
|
Allard; Edward F. (7830 Greeley Blvd., Springfield, VA 22152)
|
| Appl. No.:
|
395596 |
| Filed:
|
August 18, 1989 |
| Current U.S. Class: |
250/214VT; 313/542 |
| Intern'l Class: |
H01J 031/50 |
| Field of Search: |
250/213 VT,232,207
313/542,544
|
References Cited
U.S. Patent Documents
| 3407046 | Jun., 1968 | Schagen et al. | 313/544.
|
| 3783299 | Jan., 1974 | Houston | 250/213.
|
| 3814968 | Jun., 1974 | Nathanson et al. | 313/542.
|
| 3980880 | Sep., 1976 | D'Agostino | 250/213.
|
| 4134010 | Jan., 1979 | Eberhardt | 250/213.
|
| 4362933 | Dec., 1982 | Kroener et al. | 250/213.
|
| 4837631 | Jun., 1989 | Hicks, Jr. | 250/213.
|
Primary Examiner: Nelms; David C.
Assistant Examiner: Le; Que Tan
Claims
I claim:
1. A proximity focused direct view, electro-optical converter for
converting a target scene lying within the visible to far infrared region
of the electro-magnetic spectrum into an enhanced visible image,
comprising:
photon detector means having input and output surfaces responsive to a
preselected band of frequencies;
means for focusing a photon image of a target scene onto the input surface
of said detector, whereby the photons excite said detector to generate and
store charge carriers commensurate with the intensity and location of
photons falling upon the input surface;
means for generating an electric field;
an electron to photon converter means, whereby said electric field
generating means causes a discharge of said charge carriers from the
output surface of said detector, in the form of electrons, which are
focused onto and strike said electron to photon converter means for
effecting thereon an enhanced image of the target scene.
2. The apparatus of claim 1, further including a chopper means for
periodically interrupting the flow of photons from the target scene at a
prescribed frequency in order to allow the photon detector to properly
discharge the accumulated charge carriers, whereby the detector may be
again exposed to the scene for recharging the dectector means and
repeating the operation.
3. The apparatus of claim 2, wherein said photon detector means includes a
layer of material particularly responsive to the specific frequency of the
electro-magnetic spectrum desired and a layer of electron emissive
material on the output surface of said detector for effecting the transfer
of electrons from the detector to the electron to photon converter means.
4. The apparatus of claim 3, wherein said electron emissive material
consists of isolated portions of the emissive material to provide better
transfer of said electrons to said electron to photon converter means.
5. The apparatus of claim 4, wherein the isolated portion of emissive
material form individual electron emitter and are isolated by a material
which readily changes its electrical state from an insulator to a
conductor upon the application of an electric field, whereupon electrons
are released from the surface of the electron emitters as the chopper cuts
off the flow of photons falling on the input surface of the photon
detector and an electric field is impressed across the electron emitters,
whereby the released electrons are accelerated toward the electron to
photon converter means for providing an enhanced high resolution image
thereon.
6. The apparatus of claim 5, wherein said electron emitters are configured
as pin electrodes, whereby the charge thereon is concentrated near the tip
of the pin for effecting a higher concentration of electron flow to the
portion of said electron to photon converter having the closest proximity
to the tip of the electron emissive pin.
7. The apparatus of claim 6, wherein said electric field generating means
comprises a conductive mesh, which, when energized, creates a field across
the emitter isolating material to render the material conductive, thereby
connecting the emitters to a predetermined biasing level, whereupon the
mesh is de-energized allowing the isolating material to revert back to its
insulative state, whereby the detector may be again charged to repeat the
cycle.
8. An electrostatic lens in a controllable electric field environment
comprising a cathode and an anode spaced in a parallel relationship.
said cathode having input and output surfaces whereupon the input surface
is sensitive to an applied electron charge constituting a varying charge
density pattern along the surface of the material in accordance with the
varying intensity of a representatively applied image with the output
surface including a multiple array of electronically isolated emitters for
storing the charge carriers commensurate with the intensity and location
across the input surface of the electron image imposed on the input
surface of the cathode;
said anode being placed in close proximity to said cathode such that upon
the application of an electric field the stored charge carriers are caused
to microdischarge and generate a like charge of varying intensity on the
anode, thus focusing and enhancing the charge impinging on the input
surface of the cathode.
9. The electrostatic lens of claim 8, wherein the multiple array of
electronically isolated emitters comprise extended surface areas upon
which charge carriers are continuously stored on the point of the extended
surface areas until microdischarged by the application of an electric
field sufficient to pull the charge off the tips for effecting a transfer
of the charge pattern to the anode.
10. The electrostatic lens of claim 9, wherein the electric field applied
to the cathode is of a magnitude of the order of 10.sup.4 to 10.sup.6
c/cm.
11. The electrostatic lens of claim 10, wherein the surface of the anode
parallel to the cathode contains a like number of extended surface areas,
whereby upon discharge of the stored charges from the output surface of
the cathode, the charge is transferred to like positioned extended
surfaces on the anode to effect an enhanced and more focused image on the
anode than was applied to the input surface of the cathode.
Description
BACKGROUND OF THE INVENTION
Prior Art
Many types of electro-optical devices are used to detect and image a scene.
The scene radiates energy by self emission, as in the case of thermal
radiation, or it can reflect radiation, as in the case of reflected
sunlight, or it can radiate and reflect simultaneously. In any case,
radiation in the form of photons or electro-magnetic radiation from a
scene is directed to a lens which focuses the photons onto a detector or
an array of detectors. The lens and detector are matched for the passband
of radiation of interest and a system designed for operation in a
particular part of the spectrum uses a detector that responds to photos in
the same part of the spectrum. The early development of electro-optical
systems has been concerned mainly with the detector and a means to read
the detected signal. Television camera systems use photocathodes to
capture scene photons and electronic beam scanning to read the
photocathodes whereas image intensifier (I.sup.2) systems use
photocathodes and either electron-optics to accelerate the photoelectrons
from the photocathode microchannel plates (MCP) to amplify the
photoelectrons. Thermal imaging systems use photon or thermal detector
which absorb thermal photons. Photon detectors absorb thermal photons and
convert them into electron-hole pairs whereas thermal detectors absorb
thermal photons and convert them into temperature changes in the detector.
Thermal systems use various types of scanning schemes, such as
electron-beam, mechanical or electronic scanning.
In principle, image intensifier systems are the simplest type of image
converters as they do not require any type of scanning. Accordingly, they
are referred to as direct view devices, which depend on photoelectrons
from photocathodes to convert images. Photocathodes have limited spectral
response characteristics and require an ambient light level to function.
The subject invention provides for an extended spectral response for
I.sup.2 devices by using detectors that have extended spectral responses
in lieu of the regular photocathode. Thus, the simplicity of an I.sup.2
system may be applied to imaging systems that respond in various parts of
the electro-magnetic spectrum, but especially in the thermal infrared
band.
The technology of cold cathode emission has been used for imaging purposes
and uses tunnel electrons that tunnel through a metallic surface under the
influence of a strong electric field. The electric field lowers the
surface potential barrier of the metal allowing electrons to tunnel their
way through the surface. The resulting current from the tunnel electron
phenomenon depends on the metal's work function and the applied electric
field with the tunnel current being highly non-linear. If an array of flat
cold cathode electrodes be used for imaging purposes, the field and work
function must be tightly controlled to prevent image non-uniformity or
fixed pattern noise. In addition, since the cold cathode emission process
is so non-linear, a very small change in the applied voltage produces a
large change in the tunnel current which limits the usefulness of a cold
cathode emission array from a contrast viewpoint, as small changes in
contrast require microscopic changes in voltage which is extremely
difficult to achieve.
SUMMARY OF THE INVENTION
The invention uses a new technique to read signals off a detector or a
detector array.
Signals from an optical scene are converted into electrical signals and
temporarily stored in a detector or an array of detectors. The electrical
signals are pulled away from the detectors by an electric field. The
pulled away signal is a microdischarge of electrons that are focused onto
another surface. The second surface converts the electrons into another
form of energy. The transfer of signal is a parallel processing technique
that requires no scanning.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 shows microdischarge from a cathode to an anode.
FIGS. 2a, 2b and 2c show electron discharge from various emitters.
FIG. 3 shows a line of charged emitters set opposite a line of pin anodes.
FIG. 4 shows a device that converts incoming radiation into electrons where
the electrons are stored on pins and where the pins are connected by a
material that can change its conductive state from an insulator to a
conductor whereby when an electric field is applied the pins discharge to
an anode.
FIG. 5 shows a view of an array of isolated conductors connected by a
material that can change its electric state from conductive to insulative
by applying an electric field across the material.
FIG. 6 shows a set of pins on a thin film material that can change its
electrical state by applying an electric field across it.
FIG. 7 shows a detector array where the rows have grooves between them in
order to reduce heat transfer.
FIG. 8 shows a detector array where each detector element has grooves
around it in order to reduce heat transfer and the elements are connected
by a semiconductor wire.
FIG. 9 is an end view of FIG. 8 which shows more detail of the
semi-conductor wire which connects the elements of FIG. 8.
FIGS. 10a and 10b show a receiving screen whereby the screen is an array of
extended surfaces that help focus microdischarge electrons to a smaller
area on the screen. FIG. 10b shows a readout device that can store
microdischarged electrons on the screen itself.
FIG. 11 shows the major components of a practical device where photons are
converted to electrons whereby by microdischarge the electrons are
amplified and focused onto a phosphor screen where they are converted into
visible photons.
FIG. 12 shows a practical device consisting of an objective lens, a
chopper, a microdischarge image converter, a light amplifier and an
eyepiece.
DESCRIPTION OF THE PREFERRED EMBODIMENTS
This invention may perhaps be best understood by making reference to the
several drawings. FIG. 1 shows an array of extended surfaces (1), in this
instance two pins, but the array can be millions of pins extending in two
directions. The array is attached to a cathode (2). Opposite the array (1)
are other extended surfaces (3) attached to an anode (4). An electric
field (5) is impressed between the cathode and anode. If the electric
field is strong enough, tunnel electrons will be pulled away from the
extended surfaces (1), called emitters. From electrostatics, the field at
the tip of the emitters is higher than the field (6) between the emitters.
Tunnel electrons from (1) will be focused onto the extended surface (3).
If the extended surfaces (3) were removed, the tunnel electrons from (1)
would still be focused in the neighborhood of (3). The extended surface
(1) and (3) are part of an electrostatic lens that is used to focus the
electrons from each emitter onto an area opposite it.
An expression for the tunnel current is given by:
##EQU1##
where .phi.=surface work function
F=electric field
f(y)=is a variable which takes into account the classical image force on
the surface.
Temperature of emitters below 900.degree. K. is not a factor. The tunnel
electrons tunnel their way through the surface's (emitter surface)
potential barrier due to the applied electric field. The field lowers the
potential barrier. The potential barrier required for an electron to
escape the surface is given by:
##EQU2##
where x is an electron's position outside the metal surface and
W=.phi.+.epsilon. and .epsilon.=the fermi level of the metal.
When electrons receive this energy, they jump over the barrier. The term
e.sup.2 is associated with a classical image force.
Experimental data show that for a metal of work function 4.5, a field near
1.1.times.10.sup.7 v/cm is required to generate a current of 10.sup.-12
amp/cm.sup.2. A field of 10 .times.10.sup.7 v/cm calculates to a current
of 6.times.10.sup.-19 amp/cm.sup.2. This non-linear effect renders cold
cathode emission impractical for imaging purposes.
FIG. 2 shows an additional method for better focusing.
FIG. 2a shows a cone (7) which encloses an area where most of the tunnel
electrons are emitted from the extended surface (8) with work function
.phi.. FIG. 2b shows that if a small ares (9) on the extended surface is
changed to a lower work function, a more narrow cone of electron
trajectories can be made. The 100.degree. and 30.degree. values are
reported in the technical literature and they are given as an example.
FIG. 2c shows a flat electrode (10) of work function .phi..sub.1 with a
small area (11) of work function .phi..sub.2. Tunnel electrons will be
pulled away from (11) before (10) for an increasing electric field.
Focusing of electrons from the electrode (10) is improved by the addition
of the area (11).
FIG. 3 shows a cathode (12) with an array of emitters (13) that are
electrically isolated. Electrical pulses (14) are used to charge the
emitters (13). Opposite the cathode is an anode (15) with extended
surfaces (16). The surface potential barrier of an emitter's surfaces is
lowered by the induced charge on the emitter. Macroscopically by the Law
of Gauss, all charge resides on the surface. Microscopically, the charge
can be located on layers of the surface accompanied by shield effects. The
form of the potential is given by:
##EQU3##
where s(.sigma.) is a shielding factor and
.sigma. is the surface charge density
Experimental data show that a field of only 10.sup.4 v/cm will totally
discharge a charged sphere with 10.sup.10 electrons on it. If the electric
field is increased to even 10.sup.6 v/cm, all electrons are discharged.
The microdischarge is not sensitive to the field as long as the field is
high enough to cause complete microdischarge. From the discussion of FIG.
1, it was seen that a field of 1.1.times.10.sup.7 v/cm was required for
tunnel electrons and that a small change in the field made a dramatic
change in the current. In the microdischarge case, a large change in the
field results in no change in the microdischarge. The same electric field
is used to pull away all the charge from each electrode at the same time.
This is a parallel signal transfer process.
FIG. 4 shows how microdischarge is used for image conversion in the case of
a thermal detection system. Chopper (17) alternately allows radiation from
a scene to fall on the front surface (18) of a detector (19). The front
surface (18) serves many functions. In the case of a thermal detector it
is an absorbing surface that absorbs thermal radiation. The absorbed
radiation heats small areas of (18) in proportion to the focused image on
(18). It also serves an an electrode for detector (19). Surface (18) can
be a transparent electrode for other detectors. Emitters (20) are attached
to detector (19) in an array. Only the side view is shown in the figure. A
material (21) is connected to the emitters (20). This material can change
its electrical state from insulator to conductor. Materials, such as CdSe,
will change from an electrical conductor to an insulator or vice versa
when an electric field is applied across the material. Conductive mesh
(22) is used as one electrode to change material (21) from an insulator to
a conductor. Front surface (18) is the other electrode. When a field from
(22) to (18) is impressed on material (21), the material is switched from
a insulative state to a conductive state. Where the field is switched off,
the material switches back to its insulative state. Surface (23) is a thin
film electrode, as found on various types of metallized phosphor screens
(24). Pockets of electrons (25) are pulled away from the emitters (20) by
a field used to pull away the electrons. It does not depend on the source
of the electric field, or the position of the electrodes. The positions of
electrodes in FIG. 4 are for a particular device. When the chopper (17)
allows focused radiation to fall on absorbing electrode (18), small areas
of the electrode change their temperature in proportion to the absorbed
radiation. The change in temperature at the local areas, changes the
temperature of the thermal detector at the same locations. Thermal
detectors, such as pyroelectric materials, change their polarization when
heated and release electrons that were used to neutralize the polarization
before heating. These released electrons move to the tips of the emitters.
When the chopper begins to close the windows, an electric field is
impressed on electrode (23). This field pulls away the charges on the
emitters by microdischarge. The pulled away electrons are accelerated
across the gap, focused onto electrode (23) where they give up some of
their energy, and are converted by phosphor (24) into photons. When the
chopper blocks the radiation, the detector cools to the temperature of the
chopper blade. For stable operation, the emitters (20) must be replenished
with electrons before the chopper opens the window again. The replenishing
process takes place when mesh (22) is energized to create a field across
material (21). The material becomes conductive and connects all emitters
to ground or to a predetermined voltage level. All emitters are
replenished with electrons and set to the same voltage. Mesh (22) is then
turned off and the detector is at an initial state when the chopper opens
the window again. The device operates in a pulse gated mode where the gate
is syncronized to the chopper. If the emitters are set to zero potential
when they are stabilized to the chopper blade temperature, the device can
only display scene temperatures above the chopper blade temperature. When
the scene cools the detector below the chopper blade temperature, the
emitters have a depletion of electrons, and microdischarge is zero. If the
chopper blade is cooled, microdischarge can be used to display lower scene
temperatures. Another way to detect lower scene temperature is to lower
the initial voltage state of the detector. The emitters can be set at a
voltage lower than zero which gives each electrode the same number of
non-signal electrons. These electrons represent a D.C. signal level. Under
this condition, microdischarge will contain signal and D.C. In this case,
the chopper blade does not need to be cooled to detect lower scene
temperature.
FIG. 5 shows a two dimensional detector with a signal plane useful for
microdischarge. Electrode (26) faces the incoming radiation. Electrodes
(27) are attached to detector (28) in a two dimensional array and
electrically separated from each other. Material (29) is an insulator that
connects the electrodes and can be switched from an insulative state to a
conductive state by applying an electric field (30). Switching the
electric field off and on switches material (29) from insulative state to
conductive state. An extended surface/emitter (31) is electrically
connected to each electrode (27). The emitter (31) can have the same work
function as (27) or have a different work function. In addition (31), can
be flat with a different work function as described in FIG. 2. The
electrical separation of electrodes (27) prevents conduction of electrons
from one electrode to another when the material (29) is an insulator. This
electrical state is used when each emitter is being charged with signal
electrons. After microdischarge, the material (29) is switched to its
conductive mode which allows electrons to flow through conductors (32) so
that each emitter is set to an initial electrical state. After the
replenishing process, the material (29) is switched to its insulative
state and is ready for the open window of the chopper.
FIG. 6 is another detector that can be discharged. Electrode (33) is one
electrode for detector (34). A film of material (35) is attached to
detector (34). Emitters (36) are attached to material (35). Material (35)
has the same properties as material (29) of FIG. 5. When detector (34) is
charging and material (35) is insulative, the charge will remain localized
under the emitters. If a weak field E is turned on, the field will
concentrate at the emitters. An electric field pulse charges material (35)
momentarily to a conductor allowing the electrons under the electrodes to
flow to the emitters where they are trapped when the field is turned off.
The trapped electrons are pulled away by applying a stronger field
required for microdischarge.
FIG. 7 is another detector that can be discharged. The detectors (38) are
physically separated row from row. This separation prevents heat transfer
from row to row and any electrical transfer from row to row. Each emitter
is connected by a switchable material (39) with the same properties as
material (29) of FIG. 5.
FIG. 8 is another detector that is physically separated in two directions.
The physical separation prevents heat transfer in the horizontal and
vertical direction. The replenishing process can be achieved by connecting
each electrode in a line with compound/semiconductor line (41).
The compound line is shown in FIG. 9. In FIG. 9, electrode (40) is the same
as (40) in FIG. 8. Semiconductor line (41) is the same (41) in FIG. 8.
Electrode (42) is attached to insulator (43) which is interfaced to
material (44). Material (44) can be switched from an insulator to a
conductor and vice versa by applying a field between electrode (42) and
electrode (45). Insulator (ferroelectric material, for example) (43)
serves as an interface to (44) which is required for the switching
process. Since line (41) can be a few microns thick, there is little heat
transfer through the line from electrode to electrode. The line can be
made circular with the conductor in the center and covered by insulator
(43). This insulated conductor can be coated with a suitable material (44)
and attached to the electrodes (40). The electrode (42) replaces the wire
mesh (22) of FIG. 4.
FIG. 10 shows a one dimensional view of a two dimensional screen. The
screen is used as part of a microlens for focusing the pulled away
electrons from the emitters. FIG. 10a shows an array (46) of extended
surfaces as a conductive electrode (47). When a voltage is applied to
(47), an electric field is created between (47) and the electrode (18) of
FIG. 4. The electric field is stronger on the extended surfaces than on
the flat surface of (47). This stronger field forces the pulled away
electrons from an opposite emitter to focus near their opposite extended
surfaces, which improves the resolution of the transferred image. A
phosphor (48) converts the electrons into photons. FIG. 10a has the same
extended surfaces as 10b. The phosphor (48) is replaced with an array of
electrically isolated storage elements (49). Electrons are stored in the
elements (49), such as a CCD device, where they can be read out at output
terminal (50) by one of several read out mechanisms. The storage elements
provide a convenient means to store the image in the form of electrons. By
using appropriate addressing techniques any one element can be read out
for processing. A digital image could be generated.
Referring back to FIG. 4, the emitters (20) are charged with electrons. The
emitters themselves are part of a microlens for focusing the pulled away
electrons. FIG. 4 shows a proximity focused device where the pulled away
electrons are accelerated across a gap to strike an anode (23). The pulled
away electrons can be focused by other means. An inverter image
intensifier tube focuses photoelectrons from a photocathode by an
electrostatic lens. Another version of the same device uses a microchannel
plate (MCP) inside the tube to amplify the pulled away electrons. Still
another device uses an MCP between the photocathode and phosphor, all
three proximity focused. The array of emitters (20) of FIG. 4 can replace
the photocathodes of the various image intensifier tubes, allowing the
image intensifiers to respond to any wavelength that the detector (19)
responds to. If a pyroelectric detector is used, it generates a signal
only for a change in temperature. It is an A.C. coupled system which
avoids the problem of detecting a small A.C. signal on a large D.C.
signal. Pyroelectric detectors have a flat response across most of the
optical spectrum so they have a variety of applications. Other detectors
such as PbS respond in various parts of the spectrum, depending on the
cooling of the detector. The cooling of detectors changes their spectral
response and their sensitivity. The detector (19) of FIG. 4 can be cooled
by standard techniques, so a variety of detectors can be used.
One of the major problems of imaging with thermal photon detectors is the
large D.C. signal due to background and the small A.C. signal from a
target. A detector's electronics of present thermal imaging systems
amplifies the detector's signal and capacitively blocks out the D.C.
signal. Microdischarge techniques do not allow for A.C. coupling unless
the D.C. is subtracted out by another technique. FIG. 10a shows an
electron storage device. This device can be used to subtract out a thermal
D.C. level when used in conjunction with a chopper. Referring to FIG. 4, a
detector (19) that responds to total radiation falling on it will charge
the electrodes (20). This charge could be D.C. and signal. When the screen
(23) and (24) are replaced by the electron storage array of FIG. 10a, the
pulled away electrons are stored. The storage array could be a Charged
Couple Device (CCD). The stored electrons are read out by standard
techniques. When the chopper closes the window detector (19) with an
appropriately designed electrode (18), it sees the temperature of the back
side of the chopper's blade. storage array. When this D.C. signal is read
out by CCD read out techniques, it can be subtracted element by element
from the signal plus D.C. of the previous signal. The advantages of using
a chopper with microdischarge and with an electron storage screen are that
an expensive scanner, used with thermal imaging systems, can be eliminated
and the video electronics associated with the detectors can be eliminated.
The system can use any detector that provides electrons for the emitters.
FIG. 11 shows the major components of a practical device. Chopper blade
(51) is outside the vacuum tube whose front surface is window (52), which
allows radiation to pass through it, and a back surface (53) which
converts electrons into photons. This back surface can be replaced with
other surfaces, such as a CCD array, without affecting the operation.
Surface (54) is a detector as previously described, for example, the
detector in FIG. 5. A mesh (55) is used to switch the detector as
previously described. Several electrodes (56) are shown as switches. These
electrodes are energized by controlling electronics (not shown) outside
the vacuum tube. The controlling electronics applies the appropriate pulse
gated signals to operate the device, as previously described. The detector
and mesh are contained in the vacuum tube. There can be variations on the
same design. As previously described, the mesh (55) can be replaced by a
mesh on the detector as described in FIG. 9. A microchannel plate (MCP)
can be included in the vacuum tube to provide amplification for the pulled
away electrons. It would be located between screen (53) and mesh (55). The
design of FIG. 11 can be called a proximity focused system. The emitters
on the detector are set at an appropriate distance from the screen (53) so
that microfocusing provides the desired resolution. When an MCP is used
for amplification, the detector is proximity focused to one side of the
MCP while the other side is proximity focused to screen (53). The device
operates properly as long as the pulled away electrons are focused on a
receiving surface. The receiving surface can be located at a remote
distance as long as an electro-magnetic lens is used to focus the pulled
away electrons. An inverter image intensifier can be converted into an
inverter thermal intensifier.
FIG. 12 shows a device that uses optics (57), a chopper (58), a
microdischarge unit (59), a fiber optic coupler (60), a 1st generation
image intensifier (61), an eyepiece (62), and controlling voltage supplies
(63). Radiation is focused onto the front electrode of (59) whereby the
detector converts this radiation into electrons, whereby these electrons
are attracted to an array of pin electrodes. These charged pins are
discharged simultaneously by an electric field whereby the electrons are
accelerated across a gap, focused, and strike the phosphor. The phosphor
presents an image to a light amplifier (61). The light amplifier presents
a bright image to the eyepiece. The associated electronics supply the
necessary electric fields to discharge the pin electrodes, resupply the
electrodes with electrons and supply the required gating signals. Several
other configurations can be constructed to achieve the conversion of scene
radiation to a useable image.
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